Normal wear and tear of aging electro-mechanical trip devices on low-voltage circuit breakers can lead to loss of calibration that jeopardizes system coordination, protection and reliability.

GE has channeled its decades of trip system experience intothe development of the EntelliGuard TU Trip Unit, whichincorporates advanced algorithms that enable arc flash protection and selectivity at the same time. Upgrade and conversion kits are ANSI C37.59 design verification tested to ensure safe, reliable operation.

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